Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...
Ferroelectrics are getting a serious re-examination, as chipmakers look for new options to maintain drive current. Ferroelectric materials can provide non-volatile memory, serving an important ...
Scanning microwave microscopy (SMM) is a scanning probe method that uses the S11 parameter to calculate the local tip-sample microwave impedance. This impedance is affected by the sample’s local ...
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