Strongly correlated. Two graphene sheets stacked on each other with a twist make a long-wavelength moiré pattern. Credit: Designed by Kai Fu for Yazdani Lab, Princeton University The energy states ...
Over the past decade, demand for nano-electrical characterization has rapidly increased due to the continuous miniaturization of electronic devices. The semiconductor and microelectronics industries ...
Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...
Norwood, Mass. — Analog Devices, Inc.'s new families of capacitance-to-digital converters (CDCs) and impedance-to-digital converters (IDCs) simplify instrumentation and sensor design in industrial, ...
High-voltage capacitance-voltage (HV C-V) measurements are an increasingly important for characterizing the latest generation of wide-bandgap power semiconductor devices because the measurements are ...
In logic devices such as finFETs (field-effect transistors), metal gate parasitic capacitance can negatively impact electrical performance. One way to reduce this parasitic capacitance is to optimize ...
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