The wafer inspection business is heating up as chipmakers encounter new and tiny killer defects in advanced devices. Last month ASML Holding entered into an agreement to acquire Hermes Microvision ...

A new statistical method has been developed and successfully tested for calibrating magnetic-flux-leakage and ultrasonic in-line inspection tools from field verifications. In contrast to the methods ...

Several equipment makers are ramping up new inspection equipment to address the growing defect challenges in IC packaging. At one time, finding defects in packaging was relatively straightforward. But ...